Moore and More Journal Indexed in DOAJ

Moore and More Journal Indexed in DOAJ
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We are pleased to share that Moore and More, a peer-reviewed open-access journal dedicated to "Beyond Moore" technologies, has been indexed in the Directory of Open Access Journals (DOAJ).

DOAJ is known for its strict evaluation criteria and only indexes high-quality, peer-reviewed open-access journals. This acceptance reflects the journal’s rigorous peer review standards, transparent editorial workflows, and strong commitment to the open science movement.

"We are delighted to see Moore and More formally indexed in DOAJ. This recognition underscores our mission to accelerate global research in post-Moore technologies" said the Editors-in-Chief.

About Us

Launched in 2023 by Springer Nature in partnership with Shanghai University, Moore and More is the first top-tier journal exclusively focused on emerging innovations that extend traditional Moore’s Law. The journal publishes a wide range of content, including Original Articles, Reviews, Perspectives, News & Views, and Roadmaps.

Support for Authors

To support the global research community, the journal does not charge Article Processing Charges (APCs). Your research is made freely accessible to the world at no cost, and it is safely archived in CLOCKSS and Portico.

With the new DOAJ indexing, your published work will gain even greater visibility and impact globally.

We invite you to read our latest cutting-edge articles or consider submitting your next manuscript to Moore and More.

Explore the journal : https://link.springer.com/journal/44275

Thank you for your continued support in advancing post-Moore technologies.

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Electronic Devices
Physical Sciences > Materials Science > Materials for Devices > Electronic Devices
Electronic Circuits and Systems
Technology and Engineering > Electrical and Electronic Engineering > Electronic Circuits and Systems
Electronics and Microelectronics, Instrumentation
Technology and Engineering > Electrical and Electronic Engineering > Electronics and Microelectronics, Instrumentation